Nov 12 – 14, 2025
Hotel Lahan, Pohang, Korea
Asia/Seoul timezone

Nanoscale Projection Hard X-Ray Microscope for Statistical Analysis of Chemical Heterogeneity in Lithium-Ion Battery Cathodes

Nov 13, 2025, 2:30 PM
25m
6F Lily&Rose Hall (LAHAN Hotel)

6F Lily&Rose Hall

LAHAN Hotel

Oral Working group 3: Beamline and instrumentation

Speaker

Sugeun Jo (Pohang Accelerator Laboratory (PAL))

Description

Spatiotemporal heterogeneity of the state of charge (SOC) in battery electrodes significantly impairs the rate capability and cycle life of Li-ion batteries (LIBs). However, mapping of this heterogeneity is challenging due to the absence of experimental methods that can quantify SOC across the entire electrode scale, while also offering the nanoscale resolution for in-depth analysis of individual particles. Here, we report an advanced projection hard X-ray microscopy (PXM) offering a nanometric resolution with a large field-of-view, and high chemical sensitivity, significantly minimizing beam damage by lowering beam compared to traditional transmission X-ray microscopy (TXM) while sufficiently maintaining fast X-ray absorption near edge structure (XANES) imaging speed. Employing full-field imaging on hundreds of Ni-rich layered oxide particles during real-time (de)lithiation at various C-rates, we probed the origin of SOC heterogeneities, and revealed that the battery degradation does not occur uniformly across the entire electrode but progresses differently at the level of individual particles.

Paper submission Plan Yes
Best Presentation No

Primary authors

Prof. Jongwoo Lim (Seoul National University) Dr Jun Lim (Pohang Accelerator Laboratory) Sugeun Jo (Pohang Accelerator Laboratory (PAL))

Presentation materials

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